Sensitivity analysis of a caliper formed atomic force microscope cantilever based on a modified couple stress theory

Authors

  • M. Abbasi School of Mechanical Engineering, Shahrood Branch, Islamic Azad University, Shahrood, Iran
  • N. Abbasi Medicine Department, Tehran University of Medical Science, Tehran, Iran
Abstract:

A relationship based on the modified couple stress theory is developed to investigate the flexural sensitivity of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever, two vertical extensions and two tips located at the free ends of the extensions which form a caliper. An approximate solution to the flexural vibration problem is obtained using the Rayleigh–Ritz method. The results show that the sensitivities of AFM ACP obtained by the modified couple stress theory are smaller than those evaluated by the classical beam theory at the lower contact stiffness. The results also indicate that the flexural sensitivities of the proposed ACP are strong size dependant when the thickness of the cantilever is close to the material length scale, especially at lower contact stiffness. Furthermore, the greatest flexural modal sensitivity occurs at a small contact stiffness of the system, in which the ratio of the cantilever thickness to the material length scale and the distance between the vertical extensions are also small. In this situation, the distance between the vertical extensions and the clamped end of the cantilever and also the vertical extensions lengths are large. The results reveal that the sensitivity of the right sidewall tip is higher than that of the left one.

Upgrade to premium to download articles

Sign up to access the full text

Already have an account?login

similar resources

sensitivity analysis of a caliper formed atomic force microscope cantilever based on a modified couple stress theory

a relationship based on the modified couple stress theory is developed to investigate the flexural sensitivity of an atomic force microscope (afm) with assembled cantilever probe (acp). this acp comprises a horizontal cantilever, two vertical extensions and two tips located at the free ends of the extensions which form a caliper. an approximate solution to the flexural vibration problem is obta...

full text

Sensitivity of an Atomic Force Microscope Cantilever with a Crack

The atomic force microscope (AFM) has become an essential tool for the measurement of surface characteristics of diverse materials on a microand nanoscale level [1]. The resolution of measurements for the AFM cantilever is related to its vibration sensitivity. Many researchers have much interest in studying the resonant frequency and sensitivity analysis of AFM cantilevers [2 4]. Cracks may be ...

full text

Scanned-cantilever atomic force microscope

We have developed a 3.6 pm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilev...

full text

Vibration analysis of a double layer microshell utilizing a modified couple stress theory

In this paper, dynamic modeling of a double layer cylindrical functionally graded (FG) microshell is considered. Modeling is based on the first-order shear deformation theory (FSDT), and the equations of motion are derived using the Hamilton's principle. It assumes that functionally graded length scale parameter changes along the thickness. Generalized differential quadrature method (GDQM) is u...

full text

A more comprehensive modeling of atomic force microscope cantilever.

This paper focuses on the development of a complete model of an atomic force microscope (AFM) micro-cantilever beam, based on considering the effects of four major factors in modeling the cantilever. They are: rotary inertia and shear deformation of the beam and mass and rotary inertia of the tip. A method based on distributed-parameter modeling approach is proposed to solve the governing equat...

full text

My Resources

Save resource for easier access later

Save to my library Already added to my library

{@ msg_add @}


Journal title

volume 7  issue 1

pages  49- 56

publication date 2016-01-01

By following a journal you will be notified via email when a new issue of this journal is published.

Hosted on Doprax cloud platform doprax.com

copyright © 2015-2023